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Semiconductors

Semiconductor AI inspection for defects that sit at the edge of visibility, low in contrast and easily mistaken for polishing traces or normal surface texture. These deployments show fabs and packaging lines catching what AOI overkills or misses, from CMP scratches to dicing chips.

Inspecting Packaged Semiconductor Chips

The Anomaly Detection tool uses deep learning technology to teach the AI model sample images of “perfect” wafers.

Semiconductor Fabrication

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Quality & Defect Inspection
SolVision · Defect detection
Run your own parts through SolVision —
Bring your defect images, get a trained inspection model back.