Defect Detection
AI defect detection answers a problem rules cannot: flaws that never look the same twice, shift position, and hide in background texture. These deployments show manufacturers training detection from a handful of labelled images, then holding accuracy as new defect types appeared.
Automated Visual Inspection for LEDs
Streamlined LED visual inspection with AI SolVision features an Instance Segmentation tool designed to identify various mini LED defects through image processing.
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Quality Inspection of Golf Clubs
With AI-based SolVision, production imperfections on club heads can be detected no matter their size, appearance, or location.
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AI Inspection for Aluminum LEDs
SolVision locates and recognizes the smallest defects and production anomalies in aluminum PCBAs through image processing.
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Quality Control of Wafer Dicing
Using SolVision’s Instance Segmentation tool, irregular lines and multi-drilling defects are labeled in sample images to train the AI model.
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Detecting Chipping Defects in Wafer Dicing
The location, size and shape of cracks vary each time, and traditional optical inspection cannot accurately identify such unpredictable defects.
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Inspecting Packaged Semiconductor Chips
The Anomaly Detection tool uses deep learning technology to teach the AI model sample images of “perfect” wafers.
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