SOLUTIONS —
SolVision
SolVision deployments where manufacturers catch surface flaws, missing components, misread characters and seal failures on PCBs, wafers, stamped metal, packaging, pharma, textiles. Rule based AOI fails when defects vary in shape and lighting; each entry shows the samples, AI tool and detection rate.
Product Deployments
Case Studies
All Products, Every Industry
AccuPick
3D Bin Picking Solution
SolVision
AI Vision Inspection System
META-aivi
AR + AI Vision Deployments
SolMotion
Vision Guided Robotics
Detecting Chipping Defects in Wafer Dicing
The location, size and shape of cracks vary each time, and traditional optical inspection cannot accurately identify such unpredictable defects.
Semiconductor Fabrication
Quality & Defect Inspection
Inspecting Packaged Semiconductor Chips
The Anomaly Detection tool uses deep learning technology to teach the AI model sample images of “perfect” wafers.
Semiconductor Fabrication
Quality & Defect Inspection
SolVision · Defect detection
Run your own parts through SolVision —
Bring your defect images, get a trained inspection model back.