Quality Inspection
AI quality inspection takes over the judgement call at the end of the line, where a product must be passed as a whole and acceptable variation looks a lot like a fault. The deployments here show final checks running at line speed without the drift that fatigue brings to human graders.
Quality Control of Wafer Dicing
Using SolVision’s Instance Segmentation tool, irregular lines and multi-drilling defects are labeled in sample images to train the AI model.
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Detecting Chipping Defects in Wafer Dicing
The location, size and shape of cracks vary each time, and traditional optical inspection cannot accurately identify such unpredictable defects.
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Inspecting Packaged Semiconductor Chips
The Anomaly Detection tool uses deep learning technology to teach the AI model sample images of “perfect” wafers.
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