{"id":89373,"date":"2025-02-25T16:28:25","date_gmt":"2025-02-25T08:28:25","guid":{"rendered":"https:\/\/solomon-3d.mesvr.tw\/?p=89373"},"modified":"2025-02-25T16:32:42","modified_gmt":"2025-02-25T08:32:42","slug":"automatisierung-der-qualitatsinspektion-von-tragerschalen","status":"publish","type":"post","link":"https:\/\/solomon-3d.mesvr.tw\/fr\/etudes-de-cas\/automatisierung-der-qualitatsinspektion-von-tragerschalen\/","title":{"rendered":"Automatisierung der Qualit\u00e4tsinspektion von Tr\u00e4gerschalen"},"content":{"rendered":"<div class=\"post-title-custom-background wp-block-group alignfull has-white-color has-text-color has-link-color eplus-wrapper wp-elements-1\" style=\"margin-top:0;margin-bottom:0;padding-top:0;padding-right:0;padding-bottom:0;padding-left:0\"><div class=\"wp-block-group__inner-container is-layout-constrained wp-container-core-group-is-layout-3110c56b wp-block-group-is-layout-constrained\">\n<div class=\"wp-block-cover alignfull eplus-wrapper\" style=\"margin-top:0;margin-bottom:0;padding-top:var(--wp--preset--spacing--50);padding-right:var(--wp--preset--spacing--20);padding-bottom:var(--wp--preset--spacing--50);padding-left:var(--wp--preset--spacing--20);min-height:220px;aspect-ratio:unset;\"><span aria-hidden=\"true\" class=\"wp-block-cover__background has-black-background-color has-background-dim\"><\/span><img fetchpriority=\"high\" decoding=\"async\" width=\"795\" height=\"1200\" class=\"wp-block-cover__image-background wp-image-56257\" alt=\"black and white labeled box\" src=\"https:\/\/solomon-3d.mesvr.tw\/wp-content\/uploads\/rozwxefl27k.jpg\" data-object-fit=\"cover\" title=\"\" srcset=\"https:\/\/solomon-3d.mesvr.tw\/wp-content\/uploads\/rozwxefl27k.jpg 795w, https:\/\/solomon-3d.mesvr.tw\/wp-content\/uploads\/rozwxefl27k-199x300.jpg 199w, https:\/\/solomon-3d.mesvr.tw\/wp-content\/uploads\/rozwxefl27k-768x1159.jpg 768w\" sizes=\"(max-width: 795px) 100vw, 795px\" \/><div class=\"wp-block-cover__inner-container is-layout-flow wp-block-cover-is-layout-flow\">\n<h2 id=\"gspb_heading-id-gsbp-d51e703b-ff95\" class=\"gspb_heading gspb_heading-id-gsbp-d51e703b-ff95\">SolVision<span class=\"gspb_heading_subtitle\">\u00c9tude de cas<\/span><\/h2>\n\n\n\n<div id=\"gspb_text-id-gsbp-7b121aa9-5d52\" class=\"gspb_text gspb_text-id-gsbp-7b121aa9-5d52\"><span style=\"\"><a href=\"https:\/\/solomon-3d.mesvr.tw\/fr\/category\/case-studies\/Semiconductors\/\" target=\"_blank\" rel=\"noreferrer noopener\">Semi-conducteurs<\/a><\/span><\/div>\n<\/div><\/div>\n\n\n<h1 class=\"has-text-align-center wp-block-post-title has-text-color has-black-color has-large-font-size\">Automatisierung der Qualit\u00e4tsinspektion von Tr\u00e4gerschalen<\/h1><\/div><\/div>\n\n\n\n<h2 class=\"wp-block-heading has-text-align-center eplus-wrapper\" id=\"detection-des-defauts-par-ia-pour-les-cadres-de-connexion-des-semi-conducteurs\"><strong><strong>D\u00e9tection des d\u00e9fauts par IA pour les cadres de connexion des semi-conducteurs<\/strong><\/strong><\/h2>\n\n\n\n<div style=\"height:50px\" aria-hidden=\"true\" class=\"wp-block-spacer eplus-wrapper\"><\/div>\n\n\n\n<div class=\"wp-block-columns eplus-wrapper is-layout-flex wp-container-core-columns-is-layout-8f761849 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column eplus-wrapper is-layout-flow wp-block-column-is-layout-flow\">\n<h2 class=\"wp-block-heading eplus-wrapper\" id=\"un-composant-cle-de-l-assemblage-des-semi-conducteurs\"><strong><strong><strong>Un composant cl\u00e9 de l&#8217;assemblage des semi-conducteurs<\/strong><\/strong><\/strong><\/h2>\n\n\n\n<p class=\"eplus-wrapper wp-block-paragraph\">Dans le processus d&#8217;assemblage des semi-conducteurs, les cadres de connexion relient les puces aux cartes de circuits imprim\u00e9s, et sont \u00e9galement utilis\u00e9s pour le transport des puces, la connexion des circuits et la transmission des signaux. Presque tous les emballages de semi-conducteurs n\u00e9cessitent un cadre de connexion, qui est produit par photogravure chimique ou estampage m\u00e9canique. \u00c0 mesure que la fabrication de semi-conducteurs devient plus sophistiqu\u00e9e, le processus de cr\u00e9ation des cadres de connexion doit am\u00e9liorer sa pr\u00e9cision et son rendement.<\/p>\n<\/div>\n\n\n\n<div class=\"wp-block-column eplus-wrapper is-layout-flow wp-block-column-is-layout-flow\">\n<figure class=\"wp-block-image size-large eplus-wrapper\"><img decoding=\"async\" src=\"\/wp-content\/uploads\/S001-600x607.jpg\" alt=\"AI defect detection for semiconductor lead frames\" title=\"\"><\/figure>\n<\/div>\n<\/div>\n\n\n\n<div class=\"wp-block-greenshift-blocks-titlebox gspb_titleBox gspb_titleBox-id-gsbp-d7f236a4-825c\" id=\"gspb_titleBox-id-gsbp-d7f236a4-825c\"><div class=\"gs-titlebox\"><div class=\"gs-title-inbox\"><div class=\"gs-titlebox-icon\"><\/div><div class=\"gs-title-inbox-label\"><\/div><\/div><div class=\"gs-titlebox-text\">\n<h2 class=\"wp-block-heading eplus-wrapper\" id=\"des-arriere-plans-complexes-peuvent-affecter-les-taux-de-detection\"><strong><strong>Des arri\u00e8re-plans complexes peuvent affecter les taux de d\u00e9tection<\/strong><\/strong><\/h2>\n\n\n\n<p class=\"eplus-wrapper wp-block-paragraph\">Un seul d\u00e9faut sur un cadre de connexion peut entra\u00eener un \u00e9chec complet du semi-conducteur. Identifier les d\u00e9fauts t\u00f4t dans le processus de production est donc crucial pour aider les fabricants \u00e0 \u00e9viter de gaspiller du temps et des ressources. Les d\u00e9fauts courants des cadres de connexion incluent les bavures de bord, les impuret\u00e9s, les taches et les rayures. Lors de l&#8217;analyse des surfaces, les syst\u00e8mes de vision traditionnels tendent \u00e0 se m\u00e9langer lorsque les d\u00e9fauts sont trop similaires ou flous par rapport \u00e0 l&#8217;arri\u00e8re-plan, ce qui affecte la pr\u00e9cision de l&#8217;inspection.<\/p>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-greenshift-blocks-titlebox gspb_titleBox gspb_titleBox-id-gsbp-0deb1d81-48a5\" id=\"gspb_titleBox-id-gsbp-0deb1d81-48a5\"><div class=\"gs-titlebox\"><div class=\"gs-title-inbox\"><div class=\"gs-titlebox-icon\"><\/div><div class=\"gs-title-inbox-label\"><\/div><\/div><div class=\"gs-titlebox-text\">\n<h2 class=\"wp-block-heading eplus-wrapper\" id=\"reconnaissance-des-defauts-avec-l-intelligence-artificielle\"><strong><strong>Reconnaissance des d\u00e9fauts avec l&#8217;intelligence artificielle<\/strong><\/strong><\/h2>\n\n\n\n<p class=\"eplus-wrapper wp-block-paragraph\">Propuls\u00e9 par l&#8217;IA, <a href=\"https:\/\/solomon-3d.mesvr.tw\/fr\/products\/solvision\/\">SolVision<\/a> est un syst\u00e8me d&#8217;inspection visuelle capable d&#8217;apprendre diff\u00e9rents d\u00e9fauts de production tout en minimisant les erreurs de d\u00e9tection. L&#8217;outil d&#8217;augmentation des donn\u00e9es du logiciel aide \u00e0 \u00e9largir la port\u00e9e de formation du mod\u00e8le d&#8217;IA afin que m\u00eame les d\u00e9fauts sur des arri\u00e8re-plans complexes ou en d\u00e9sordre puissent \u00eatre reconnus. Les d\u00e9fauts obscurs, les bords ou taches noires, et les saillies de bord peuvent \u00e9galement \u00eatre identifi\u00e9s avec pr\u00e9cision.<\/p>\n<\/div><\/div><\/div>\n\n\n\n<p class=\"eplus-wrapper wp-block-paragraph\"><\/p>\n\n\n\n<div class=\"wp-block-group eplus-wrapper\"><div class=\"wp-block-group__inner-container is-layout-flow wp-block-group-is-layout-flow\">\n<h2 class=\"wp-block-heading has-text-align-center has-black-color has-text-color eplus-wrapper\" id=\"inspection-par-ia\"><strong><strong><strong><strong>Inspection par IA<\/strong><\/strong><\/strong><\/strong><\/h2>\n\n\n\n<div class=\"wp-block-columns eplus-wrapper is-layout-flex wp-container-core-columns-is-layout-8f761849 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column eplus-wrapper is-layout-flow wp-block-column-is-layout-flow\">\n<p class=\"has-text-align-center eplus-wrapper wp-block-paragraph\"><strong>\u00c9chantillon d&#8217;or<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-image size-large eplus-wrapper\"><img decoding=\"async\" src=\"\/wp-content\/uploads\/S003-600x616.png\" alt=\"Automating Quality Inspection of Lead Frames\" title=\"\"><\/figure>\n<\/div>\n\n\n\n<div class=\"wp-block-column eplus-wrapper is-layout-flow wp-block-column-is-layout-flow\">\n<p class=\"has-text-align-center eplus-wrapper wp-block-paragraph\"><strong>Taches noires et bords sur\u00e9lev\u00e9s<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-image size-large eplus-wrapper\"><img decoding=\"async\" src=\"\/wp-content\/uploads\/S004-600x601.jpg\" alt=\"Automating Quality Inspection of Lead Frames\" title=\"\"><\/figure>\n<\/div>\n<\/div>\n<\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>\u00c0 mesure que la fabrication de semi-conducteurs devient plus sophistiqu\u00e9e, le processus de cr\u00e9ation des cadres de connexion doit s&#8217;am\u00e9liorer en pr\u00e9cision et en rendement.<\/p>","protected":false},"author":875,"featured_media":56257,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"_gspb_post_css":"#gspb_heading-id-gsbp-d51e703b-ff95{font-size:60px;line-height:100px;text-align:center!important;color:var(--gs-colorone);margin-top:50px}#gspb_heading-id-gsbp-d51e703b-ff95 .gsap-g-line{text-align:center!important}#gspb_heading-id-gsbp-d51e703b-ff95 .gspb_heading_subtitle,#gspb_subheading-id-gsbp-d51e703b-ff95{display:block;line-height:22px;margin-top:5px;font-size:30px;color:var(--wp--preset--color--white, #ffffff)}.gspb_text-id-gsbp-7b121aa9-5d52{font-size:20px;text-align:center!important;font-weight:500!important}.gspb_text-id-gsbp-7b121aa9-5d52 .gsap-g-line{text-align:center!important}.gspb_text-id-gsbp-7b121aa9-5d52,.gspb_text-id-gsbp-7b121aa9-5d52 .wp-block a,.gspb_text-id-gsbp-7b121aa9-5d52 a{color:var(--wp--preset--color--white, #ffffff)}.gspb_text-id-gsbp-7b121aa9-5d52 .wp-block a:hover,.gspb_text-id-gsbp-7b121aa9-5d52 a:hover,.gspb_text-id-gsbp-7b121aa9-5d52:hover{color:var(--gs-colorone)}.gs-titlebox{background:#fff;line-height:24px;font-size:90%;box-shadow:0 10px 10px #00000007;margin-bottom:25px}.gs-titlebox-text>p{margin-bottom:20px!important;margin-top:0}.gs-titlebox-text>p:last-of-type{margin-bottom:0!important}#gspb_titleBox-id-gsbp-0deb1d81-48a5 .gs-titlebox .gs-title-inbox,#gspb_titleBox-id-gsbp-d7f236a4-825c .gs-titlebox .gs-title-inbox{color:var(--wp--preset--color--black, #000000)}#gspb_titleBox-id-gsbp-0deb1d81-48a5 .gs-titlebox .gs-title-inbox svg,#gspb_titleBox-id-gsbp-d7f236a4-825c .gs-titlebox .gs-title-inbox svg{fill:var(--wp--preset--color--black, #000000)}.gs-titlebox .gs-title-inbox{display:flex;align-content:center;padding:15px 20px;font-weight:700;font-size:115%}.gs-titlebox .gs-title-inbox-label{flex-grow:1}.gs-titlebox .gs-titlebox-text{padding:20px}","footnotes":""},"categories":[3620,3600,3670,3688],"tags":[],"class_list":["post-89373","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-etudes-de-cas","category-detection-de-defauts","category-semiconductors","category-solvision"],"acf":[],"lang":"fr","translations":{"fr":89373,"en":32245,"es":81630,"tw":32434,"zh":56990,"jp":78422,"pt":86654,"de":88561,"tr":90548,"vi":91680,"th":96938,"it":97837,"ko":95056},"_links":{"self":[{"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/posts\/89373","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/users\/875"}],"replies":[{"embeddable":true,"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/comments?post=89373"}],"version-history":[{"count":0,"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/posts\/89373\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/media\/56257"}],"wp:attachment":[{"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/media?parent=89373"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/categories?post=89373"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/solomon-3d.mesvr.tw\/fr\/wp-json\/wp\/v2\/tags?post=89373"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}